Characterization of thin metal film growth on an organic self-assembled-monolayer using current-sensing atomic force microscopy

CHED 951

Sean E. Keuleyan, seank@temple.edu1, Yangjun Xing, yangjun@temple.edu1, Jacqueline Hines, jhines@asrdcorp.com2, and Eric Borguet1. (1) Department of Chemistry, Temple University, 130 Beury Hall, 1901 N. 13th Street, Philadelphia, PA 19122, (2) Applied Sensor Research & Development Corporation (ASR&D), 1195 Baltimore-Annapolis Blvd. Unit #2, MD 21012
Thin metal films on grown on self-assembled-monolayers (SAMs) are of interest for a number of applications. For example, thin palladium metal films on organic SAMs have been shown to be promising hydrogen sensors via the changes in conductivity which occur upon hydrogen exposure. Understanding the mechanisms of metal film growth at the nanoscale is important to predicting how the system operates at different metal and/or organic film thicknesses. In this study, we use current sensing atomic force microscopy to simultaneously measure the electrical conductivity and morphology of the metal/SAM systems.