Harnessing wrinkling instabilities for advanced measurements of polymeric thin films

PMSE 111

Jun Young Chung, junyoung.chung@nist.gov1, Rui Huang, ruihuang@mail.utexas.edu2, and Christopher M. Stafford1. (1) Polymers Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, (2) Department of Aerospace Engineering and Engineering Mechanics, University of Texas, Austin, TX 78712
Nanotechnology promises to revolutionize a growing set of materials applications ranging from electronics to drug delivery to ballistic protection. However, the quest to engineer materials on the nanoscale is met with the daunting task of measuring the physical and mechanical properties of these systems at these same length scales. For polymers, the challenge is even greater since conventional materials testing platforms lack the resolution for such soft systems. In this presentation, we will briefly review and discuss our current progress and advances in wrinkling metrology for characterizing physical, thermal, and mechanical properties of nanoscale polymeric materials.