Nanoscale Raman imaging using a dual atomic force/near-field scanning optical microscope

PHYS 496

Kent A. Meyer, meyerka@ornl.gov, Kevin L Shuford, shufordkl@ornl.gov, William B. Whitten, whittenwb@ornl.gov, and Robert W. Shaw, shawrw@ornl.gov. Chemical Sciences Division, Oak Ridge National Laboratory, PO Box 2008, MS 6142, Oak Ridge, TN 37831
We developed a tuning fork-based dual atomic force and near-field scanning optical microscope (AFM/NSOM) with the capability of investigating non-linear optical phenomena at sub-diffraction limited resolution. Plasmonic enhancement of the electric field at the tip of the AFM/NSOM probe is critical for nanoscale non-linear spectroscopy. For preliminary investigations, we used a tip-enhanced probe with the AFM/NSOM to image the 1330 cm-1 Raman mode of a polycrystalline diamond thin film.

This work was supported by the Division of Chemical Sciences, Geosciences, and Biosciences, Office of Basic Energy Sciences, U.S. Department of Energy, under contract DE-AC05-00OR22725 with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC.

 

PHYS Poster Session - Nanostructured Materials and Nanophotonics
7:30 PM-10:00 PM, Wednesday, April 9, 2008 Morial Convention Center -- Hall A, Poster

Division of Physical Chemistry

The 235th ACS National Meeting, New Orleans, LA, April 6-10, 2008