Single photon emission behavior from indium phosphide nanoparticles

PHYS 418

Kent A. Meyer, meyerka@ornl.gov1, William B. Whitten, whittenwb@ornl.gov1, Robert W. Shaw, shawrw@ornl.gov1, Kin Ng, kinn@csufresno.edu2, and Tingying Zeng, tingying.zeng@wku.edu3. (1) Chemical Sciences Division, Oak Ridge National Laboratory, PO Box 2008, MS 6142, Oak Ridge, TN 37831, (2) Department of Chemistry, California State University, Fresno, 2555 E San Ramon, MS SB/70, Fresno, CA 93740, (3) Department of Chemistry, Western Kentucky University, 1906 College Heights Blvd, #11079, Bowling Green, KY 42101-1079
Bright emission behavior was observed from individual indium phosphide nanoparticles adsorbed on glass. Individual particle emission behavior was investigated using total internal reflection fluorescence (TIRF) microscopy imaging and photon antibunching detection. The emission pattern was similar to that of a single quantum system and dipole oriented, with little to no “blinking” on timescales greater than 100 ms. Atomic force microscopy (AFM) experiments indicate that both individual particles and dimers are present on the glass surface. Individual fluorescence spectra indicate surface trapping on the particles. These results provide motivation for correlated AFM/TIRF experiments.

This work was supported by the Division of Chemical Sciences, Geosciences, and Biosciences, Office of Basic Energy Sciences, U.S. Department of Energy, under contract DE-AC05-00OR22725 with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC.

 

PHYS Poster Session - Nanostructured Materials and Nanophotonics
7:30 PM-10:00 PM, Wednesday, April 9, 2008 Morial Convention Center -- Hall A, Poster

Division of Physical Chemistry

The 235th ACS National Meeting, New Orleans, LA, April 6-10, 2008