Determination of silver nanowires elastic modulus by means of longitudinal buckling instability

PMSE 112

Ray Gunawidjaja, rayguna@gatech.edu, Chaoyang Jiang, and V. V. Tsukruk, vladimir@mse.gatech.edu. School of Materials Science and Engineering, Georgia Institute of Technology, 771 Ferst Drive, NW, Atlanta, GA 30332-0245
There are numerous potential applications for one-dimensional nanostructures, such as mechanical reinforcement, field effect transistor, Plasmon waveguide and electrical- and thermal-conductive fillers. The knowledge of mechanical property of one-dimensional nanostructures is thus critical for the design of functional systems. The current techniques that are available involve the use of atomic force microscopy that are often time-consuming. Here, we demonstrate the feasibility of using the well-known buckling instability technique on an array of highly-oriented silver nanowires encapsulated within a polymeric film to determine silver nanowire elastic modulus.