Determination of silver nanowires elastic modulus by means of longitudinal buckling instability

PMSE 112

Ray Gunawidjaja, rayguna@gatech.edu1, Chaoyang Jiang2, and Vladimir V. Tsukruk, vladimir@mse.gatech.edu1. (1) School of Materials Science and Engineering and School of Polymer, Textile and Fiber Engineering, Georgia Institute of Technology, 771 Ferst Drive, Atlanta, GA 30332, (2) Department of Chemistry, University of South Dakota, 414 East Clark Street, Vermillion, SD 57069
There are numerous potential applications for one-dimensional nanostructures, such as mechanical reinforcement, field effect transistor, Plasmon waveguide and electrical- and thermal-conductive fillers. The knowledge of mechanical property of one-dimensional nanostructures is thus critical for the design of functional systems. The current techniques that are available involve the use of atomic force microscopy that are often time-consuming. Here, we demonstrate the feasibility of using the well-known buckling instability technique on an array of highly-oriented silver nanowires encapsulated within a polymeric film to determine silver nanowire elastic modulus.