PHYS 669 |
| Thermal characterization of nanowires and of the nanointerfaces between nanowires and supporting electrodes is critical for understanding thermal transport at nanoscale and for the design and operation of nanoelectronics. Here we propose an AFM based method for characterization of thermal dissipation of electrically conductive individual nanowires and nanorods. Nanostructures are located by topographic imaging in regular tapping mode and are then subsequently probed by an AFM cantilever tip, with a conductive coating thus establishing electrical contact at different positions on the nanowire followed by current-voltage data acquisition. The experiment has been performed with nanostructures in contact with the surface and, in the other case, suspended between electrodes. These configurations allow for characterization of both thermal conductivity and nanointerface thermal resistance.This work presents the technique and the subsequent measurements of nanointerface thermal resistance and thermal conductivity of individual thermoelectric nanowires and metal nanorods. |
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Nanostructured Materials
8:20 AM-12:00 PM, Thursday, April 10, 2008 Morial Convention Center -- Rm. 338/339, Oral
Division of Physical Chemistry |