| Wednesday, August 22, 2007 | |||
12:00 PM-2:30 PM BCEC -- Room 103 | |||
Correlated AFM and Raman Spectroscopy: Online Pixel by Pixel Structural and Chemical Characterization | |||
| Sponsor: Nanonics Imaging Ltd., Booth 1234. Instructor: Prof. Aaron Lewis. 12:00-2:30 PM. Newest developments will be described that allow for combining scanning probe microscopies (SPM), including AFM, NSOM, etc. with Raman spectroscopy. Nanonics’ SPM systems with their open architecture and their patented no-Raman-background cantilevered probes give online AFM topographical mapping with simultaneous spectroscopic data. Surface enhanced techniques (SERS, TERS) are made possible by the use of such unique probes achieving several orders of magnitude Raman signal enhancement. Significant resolution improvements are also achieved through AFM autofocus. Nanoscale manipulation concomitant with spectroscopic mapping will also be discussed.
|
Exhibitor-Sponsored Workshop -- Session Listing
The 234th ACS National Meeting, Boston, MA, August 19-23, 2007