Development of sum-frequency generation nonlinear optical ellipsometry

ANYL 118

Christopher J. Dehen, cdehen@purdue.edu and Garth J. Simpson, gsimpson@purdue.edu. Department of Chemistry, Purdue University, 560 Oval Drive, West Lafayette, IN 47907
The use of infrared-visible sum-frequency generation spectroscopy (SFG) has developed into a remarkably powerful took for characterizing interfaces and surfaces of biological samples. However, SFG spectroscopy of complex samples has the disadvantage of containing several overlapping and broad peaks. This phenomenon can make peak separation and identification very difficult. The integration of nonlinear optical ellipsometry (NOE) capabilities into existing SFG systems can assist in interpretation of the resulting spectra. Several configurations for nonlinear optical ellipsometers have been developed in the past, but they require long acquisition times for full polarization analysis and this prohibited their incorporation into SFG systems. Recently, the discrete retardance nonlinear optical ellipometry (DR-NOE) technique for second harmonic generation NOE reduced the required time for full polarization analysis down to a few minutes. This relatively short acquisition times facilitated the integration of SFG spectroscopy and NOE analysis.
 

General Posters
7:00 PM-9:00 PM, Sunday, August 19, 2007 BCEC -- Exhibit Hall - B2, Poster

Division of Analytical Chemistry

The 234th ACS National Meeting, Boston, MA, August 19-23, 2007