Molecular precursor routes to gallium oxide

INOR 350

Claire J. Carmalt, c.j.carmalt@ucl.ac.uk and Siama Basharat. Department of Chemistry, University College London, 20 Gordon Street, Christopher Ingold Laboratories, London, WC1H 0AJ, United Kingdom

Gallium oxide (Ga2O3) is considered to be one of the most ideal materials for application as thin-film gas sensors at high temperatures. Gallium oxide (Ga2O3) is an electrical insulator at room temperature and semiconducting above 400 oC. Chemical vapour deposition (CVD) is the most practical method for preparing thin-films for large-scale applications. The versatility of metal alkoxides as precursors to metal oxides via CVD processes is widely recognised; they are easy to prepare and purify and are intrinsically non-corrosive. A range of new gallium alkoxides incorporating functionalised alkoxides have been prepared (Scheme 1).  

 

Scheme 1

 

 

 

Thin films of Ga2O3 have been formed on glass by low pressure (LP)CVD at 600 oC and aerosol assisted (AA)CVD using a molecular precursor or from the in situ reaction of Et3Ga or [Ga(NMe2)3]2 and excess alcohol. The resulting films were analyzed by powder XRD, XPS, SEM and EDAX, which showed low levels of contamination from carbon. Gas sensing experiments indicated that the films responded best to a reducing gas at 450 oC.