Session: Correlated AFM and Raman Spectroscopy : Online Pixel by Pixel Structural and Chemical Characterization


Tuesday, 12 September 2006

10:15 AM-11:00 AM Moscone Center Halls B&C
Correlated AFM and Raman Spectroscopy : Online Pixel by Pixel Structural and Chemical Characterization

Sponsor: Nanonics Imaging. Booth, 1134. Speaker: Professor Aaron Lewis. 10:15 AM to 11:00AM. Room: Presentation Theater, Halls B&C, Moscone Convention Center. New developments will be described that allow for combining scanning probe microscopies (SPM), including AFM, NSOM etc with Raman spectroscopy. Nanonics’ SPM systems with their open architecture and their patented no-Raman-background cantilevered probes give online AFM topographical mapping with simultaneous spectroscopic data. Surface enhanced techniques (SERS, TERS) are made possible by the use of such unique probes achieving several orders of magnitude Raman signal enhancement. Significant resolution improvements are also achieved through AFM autofocus. Nanoscale manipulation concomitant with spectroscopic mapping will also be discussed.