Tablet film coating quantification by means of in-line NIR spectroscopy and multivariate data analysis

I&EC 51

Jose D. Perez-Ramos, jdperez@purdue.edu1, Håkan Wikström1, Rantanen Jukka2, Lynne S. Taylor1, and Kenneth R. Morris1. (1) Department of Industrial and Physical Pharmacy, Purdue University, 575 Stadium Mall Drive, RHPH Bldg, West Lafayette, IN 47907, (2) Viikki Drug Discovery and Development Technology Center, University of Helsinki, Finland, P.O. Box 56 (Viikinkaari 5 E), FI-00014 University of Helsinki, Helsinki, Finland
A method was developed which enables In-line analysis of film coating on tablets during a pan coating operation. Real-time measurements were made using a diffuse reflectance near infrared (NIR) probe positioned inside the pan. Univariate and multivariate analysis of the NIR data, collected from replicate batches, provided for simple calibration strategies for quantification of the coating extent on the tablets. The thickness of the film coat was determined by monitoring the decrease of absorption bands characteristic of components in the tablet core and the increase of bands characteristic of components in the tablet coating. In-line measurements allow the coating process to be stopped when a predetermined tablet coating thickness is achieved. General aspects of In-line NIR spectroscopy on tablet pan coating and multivariate batch calibration are discussed.

 

Poster Session
8:00 PM-10:00 PM, Sunday, 10 September 2006 Moscone Center -- Hall D, Poster

Sci-Mix
8:00 PM-10:00 PM, Monday, 11 September 2006 Moscone Center -- Hall D, Sci-Mix

Division of Industrial & Engineering Chemistry

The 232nd ACS National Meeting, San Francisco, CA, September 10-14, 2006