What is the "speed limit" when monitoring fast processes using Time-of-flight Electrospray Ionization Mass Spectrometry?

ANYL 88

Ignacio A. Zuleta, izuleta@stanford.edu, Griffin Barbula, barbula@stanford.edu, Matthew D. Robbins, mdr@stanford.edu, Oh Kyu Yoon, okyoon@stanford.edu, and Richard N Zare. Department of Chemistry, Stanford University, Stanford, CA 94305
Hadamard Transform Time-of-flight Mass Spectrometry (HT-TOFMS) attempts to increase the duty cycle of TOF measurements of ions created by continuous ion sources, like Electrospray Ionization (ESI). In this technique, multiple ion packets are created by fast ion beam deflection and are then simultaneously injected into the drift region were the time-of-flight measurement is made. A common question about new mass analyzers regards their ability to sample fast processes: how fast can a process be before its measured time-dependent signal starts to blur? Here, we measure the dependence of the maximum repetition rate, for a given S/N ratio, on ion optical parameters and discuss the insight gained when correlating with measured transient ESI current at the source. Finally, we compare to models reported in the literature and propose a rationalization for the measured impulse response of the ESI process and its relevance to fast, high duty cycle detection approaches like HT-TOFMS.

 

General Papers
7:00 PM-9:00 PM, Sunday, 10 September 2006 Moscone Center -- Hall D, Poster

Sci-Mix
8:00 PM-10:00 PM, Monday, 11 September 2006 Moscone Center -- Hall D, Sci-Mix

Division of Analytical Chemistry

The 232nd ACS National Meeting, San Francisco, CA, September 10-14, 2006