Session: Nanotechnology and the Environment


I&EC		Tuesday, March 30, 2004

1:45 PM-3:50 PM Marriott -- Orange County 1, Oral
Nanotechnology and the Environment
Metrology for Nano-Sized Materials
Presiding:	Michael Postek John A. Small
1:45 PM		Introductory Remarks
1:50 PM	119	Quantitative analysis of individual nanoparticles by multiple-voltage x-ray emission spectroscopy John T. Armstrong, John A. Small
2:20 PM	120	Quantitative analysis of individual nanoparticles in the SEM John A. Small
2:50 PM	121	Discussion of some of the NIST research and standards development on nano-particles Michael T Postek
3:20 PM	122	Nanoscale chemical and materials characterization with near-field microscopy and spectroscopy Stephan Stranick, D. Bruce Chase, Steven A. Buntin, Chris A. Michaels
	123	Paper Withdrawn

Previous Session -- Nanotechnology and the Environment -- Next Session