COLL 497 |
| Mark A. Poggi1, Lawrence A. Bottomley1, Andrew W. McFarland2, Jonathan S. Colton2, and Peter T. Lillehei3. (1) School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, GA 30332-0400, (2) George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, 813 Ferst Drive, Atlanta, GA 30332-0560, (3) Advanced Materials and Processing Branch, NASA Langley Research Center, 6A W Taylor St, Mail Stop 226, Hampton, VA 23681-2199 |
| Quantifying the adhesive interactions between carbon nanotubes and chemical moieties that the tube comes in contact with is essential for the design of polymer composites and for nanofabrication of devices incorporating nanotubes. We have investigated the utility of force spectroscopy for measuring the adhesive force between single walled carbon nanotubes and chemically modified substrates. In this presentation, the impact of nanotube orientation on the measured interfacial adhesion will be examined. In typical AFM-based force spectroscopy experiments, cantilever deflection is monitored as a function of scanner displacement. Fitting of model(s) to the resultant force curve provides a means for measurement of the strength of the interaction. This approach is insufficient to determine the orientation of the nanotube in contact with the surface. We present herein an alternative strategy that monitors both cantilever deflection and the oscillatory behavior of the cantilever/nanotube as it is brought into contact and pulled away from the substrate. This approach provides a straightforward means for determining the strength of the nanotube-substrate interaction and its orientation at the point of contact. |
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Nanoscience and Nanotechnology
8:30 AM-11:45 AM, Thursday, April 1, 2004 Marriott -- Orange County 5, Oral
Division of Colloid and Surface Chemistry |