I&EC 119 |
| John T. Armstrong, Surface & Microanalysis Science Division, NIST, 100 Bureau Drive, Gaithersburg, MD 20899-8371 and John A. Small, Surface and Microanalysis Science Division, NIST, 100 Bureau Drive, Stop 8371, Gaithersburg, MD 20899-8371. |
| We have developed and tested analysis and correction procedures that enable quantitative x-ray emission analysis of the near-surface and underlying portions of individual particles with diameters in the size range of 50 nm to 500 nm using field emission scanning electron and Auger microscopes and energy dispersive x-ray detectors. For particles with diameters of ~100 nm or more, the particle composition can be distinguished from that of the substrate on which it lies. Detection limits and analytical accuracy for elements distributed throughout the nanoparticles exceed those for Auger electron spectroscopy and compare favorably with those for analytical transmission electron microscopy. The ability to non-destructively distinguish between surface and underlying particle compositions is unique to this technique. |
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Nanotechnology and the Environment
1:45 PM-3:50 PM, Tuesday, March 30, 2004 Marriott -- Orange County 1, Oral
Division of Industrial and Engineering Chemistry |